Start Over
You searched for: subject "Integrated circuits+Testing."

Search Results

Cover image for Test and diagnosis of analogue, mixed-signal and RF integrated circuits

Test and diagnosis of analogue, mixed-signal and RF integrated circuits

  • 2008
  • Format: Electronic
Location
Access Content Online
Cover image for Metrology for submicrometer devices and circuits

Metrology for submicrometer devices and circuits

Joyner Library - Fed Docs Stacks
Call Number: C 13.10:400-61
Cover image for Comprehensive test pattern and approach for characterizing SOS technology

Comprehensive test pattern and approach for characterizing SOS technology

Joyner Library - Fed Docs Stacks
Call Number: C 13.10:400-56
Cover image for Wafer-level testing and test during burn-in for integrated circuits

Wafer-level testing and test during burn-in for integrated circuits

Location
Access Content Online
Cover image for A production-compatible microelectronic test pattern for evaluating photomask misalignment

A production-compatible microelectronic test pattern for evaluating photomask misalignment

Joyner Library - Fed Docs Stacks
Call Number: C 13.10:400-51
Cover image for Methods for testing wire-bond electrical connections

Methods for testing wire-bond electrical connections

Joyner Library - Fed Docs Stacks
Call Number: C 13.46:786
Cover image for Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Location
Access Content Online
Cover image for Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Location
Access Content Online
Cover image for Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Location
Access Content Online
Cover image for Electronics reliability and measurement technology

Electronics reliability and measurement technology

  • 1988
  • Format: Electronic
Location
Access Content Online