Search Results
Showing 1 - 10 of 117 results
Search Results
/LC.GIF&client=easterncarolinaedu)
Metrology for submicrometer devices and circuits
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-61 | ✔ Available |
Comprehensive test pattern and approach for characterizing SOS technology
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-56 | ✔ Available |
A production-compatible microelectronic test pattern for evaluating photomask misalignment
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-51 | ✔ Available |
Methods for testing wire-bond electrical connections
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:786 | ✔ Available |
/LC.GIF&client=easterncarolinaedu)
/LC.GIF&client=easterncarolinaedu)
