Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2004 : [July 5-8, 2004, Taiwan] / edited by Steve S. Chung ... [et al.] ; organised by IEEE ED Taipei Chapter ... [et al.] ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Singapore Chapter.

Other author/creatorChung, Steve S.
Other author/creatorIEEE Electron Devices Society. Taipei Chapter.
Other author/creatorIEEE Electron Devices Society.
Other author/creatorIEEE Reliability/CPMT/ED Singapore Chapter.
Other author/creatorIEEE Xplore (Online service)
Portion of title Physical & failure analysis of integrated circuits
Cover title IPFA 2004 proceedings
Spine title 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits 2004
General note"IEEE Catalog Number 04TH8743"--T.p. verso.
General noteIssues for 18th (2011)- cataloged as a serial in LC.
Bibliography noteIncludes bibliographical references and author index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2004103511
ISBN0780384547

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