Tools

LEADER 03426cam a22005774a 4500

001 ssj0000395884;

003 WaSeSS;

005 20240612185429.0;

006 m d ;

007 cr n ;

008 070116s2007 njua sb 101 0 eng d;

010 a| 2007920884;

020 a| 1424410142 (softbound ed.);

035 a| (WaSeSS)ssj0000395884;

040 a| DLCc| DLCd| DLCd| WaSeSS;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .I47377 2007;

082 00 a| 621.3815/482| 22;

111 2 a| International Symposium on the Physical & Failure Analysis of Integrated Circuitsn| (14th :d| 2007 :c| Indian Institute of Science)?| UNAUTHORIZED;

245 10 a| Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuitsh| [electronic resource] :b| IPFA 2007 /c| edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.;

260 a| Piscataway, NJ :b| IEEE,;

300 a| 309 p. :b| ill. ;c| 30 cm.;

500 a| "11 to 13 July 2007 JN Tata Auditorium, Indian Institute of Science, Bangalore, India"--Cover.;

500 a| "IEEE catalog number 07TH8945."--T.p. verso.;

500 a| Accompanied by: IPFA 2007 final programme.;

500 a| Issues for 18th (2011)- cataloged as a serial in LC.5| DLC;

504 a| Includes bibliographical references and author index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Defectsv| Congresses.=| ^A42814;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Integrated circuitsx| Reliabilityv| Congresses.=| ^A725830;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Mahapatra, Souvik.=| ^A1294480;

700 1 a| Radhakrishnan, M. K.?| UNAUTHORIZED;

710 2 a| IEEE ED/SSC Chapter, Bangalore.?| UNAUTHORIZED;

710 2 a| IEEE Electron Devices Society.=| ^A85580;

710 2 a| IEEE Reliability/CPMT/ED Singapore Chapter.=| ^A728393;

710 2 a| IEEE ED/AP Chapter, Bombay.?| UNAUTHORIZED;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Conference Proceedings Archive 2005-2009u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D4378045;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D4378045;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D4378045;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4690538;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4690538-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 4/14/2017x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4690538-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 4/14/2017x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4690538-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 4/14/2017x| EBOOKz| JERESOURCE;

Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.

Author/creator	International Symposium on the Physical & Failure Analysis of Integrated Circuits
Format	Electronic
Publication Info	Piscataway, NJ : IEEE,
Description	309 p. : ill. ; 30 cm.
Supplemental Content	Full text available from IEEE Conference Proceedings Archive 2005-2009
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Integrated circuits--Defects. --Congresses. Integrated circuits--Testing. --Congresses. Integrated circuits--Reliability. --Congresses.

Other author/creator	Mahapatra, Souvik.
Other author/creator	Radhakrishnan, M. K.
Other author/creator	IEEE ED/SSC Chapter, Bangalore.
Other author/creator	IEEE Electron Devices Society.
Other author/creator	IEEE Reliability/CPMT/ED Singapore Chapter.
Other author/creator	IEEE ED/AP Chapter, Bombay.
Other author/creator	IEEE Xplore (Online service)
General note	"11 to 13 July 2007 JN Tata Auditorium, Indian Institute of Science, Bangalore, India"--Cover.
General note	"IEEE catalog number 07TH8945."--T.p. verso.
General note	Accompanied by: IPFA 2007 final programme.
General note	Issues for 18th (2011)- cataloged as a serial in LC.
Bibliography note	Includes bibliographical references and author index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2007920884
ISBN	1424410142 (softbound ed.)

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