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016 7 a| 0142355352| Uk;

020 a| 9780863417450 (pbk.);

020 a| 0863417450 (pbk.);

035 a| (WaSeSS)ssj0000311255;

042 a| ukblcatcopya| lccopycat;

049 a| EREEa| NEHH;

050 00 a| TK7874.654b| .T47 2008;

082 04 a| 621.381502872| 22;

245 00 a| Test and diagnosis of analogue, mixed-signal and RF integrated circuitsh| [electronic resource] :b| the system on chip approach /c| edited by Yichuang Sun.;

260 a| London :b| Institution of Engineering and Technology,c| 2008.;

300 a| xx, 389 pages :b| illustrations ;c| 24 cm;

490 1 a| Circuits, devices and systems series ;v| 19;

504 a| Includes bibliographical references and index.;

505 0 a| Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.;

506 a| Available only to authorized users.;

520 8 a| No further information has been provided for this title.;

538 a| Mode of access: World Wide Web;

650 0 a| Linear integrated circuitsx| Testing.=| ^A58560;

650 0 a| Mixed signal circuitsx| Testing.=| ^A868362;

650 0 a| Radio frequency integrated circuitsx| Testing.=| ^A871624;

650 4 a| Linear integrated circuits / Testing.;

650 4 a| Mixed signal circuits / Testing.;

650 4 a| Radio frequency integrated circuits / Testing.;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Sun, Yichuang.=| ^A580121;

710 2 a| Institution of Engineering and Technology.=| ^A635009;

830 0 a| IET circuits, devices and systems series ;v| 19.=| ^A1255207;

856 40 z| Full text available from IET Digital Library - Booksu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fdigital-library.theiet.org%2Fdoi%2Fbook%2F10.1049%2FPBCS019E;

947 a| (OCoLC)ocn180473599;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6477193-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 9/14/2024x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6477193-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 9/14/2024x| EBOOKz| JERESOURCE;

Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach / edited by Yichuang Sun.

Other author	Sun, Yichuang.
Other author	Institution of Engineering and Technology.
Format	Electronic
Publication Info	London : Institution of Engineering and Technology, 2008.
Description	xx, 389 pages : illustrations ; 24 cm
Supplemental Content	Full text available from IET Digital Library - Books
Subjects	Linear integrated circuits--Testing. Mixed signal circuits--Testing. Radio frequency integrated circuits--Testing. Linear integrated circuits / Testing. Mixed signal circuits / Testing. Radio frequency integrated circuits / Testing.

Series	Circuits, devices and systems series ; 19 IET circuits, devices and systems series ; 19. ^A1255207
Contents	Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.
Summary	No further information has been provided for this title.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2012276390
ISBN	9780863417450 (pbk.)
ISBN	0863417450 (pbk.)

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Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach / edited by Yichuang Sun.

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