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Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.10:400-98 | ✔ Available |
Semiconductor measurement technology
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.10:400-92 | ✔ Available |
Metrology for submicrometer devices and circuits
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-61 | ✔ Available |
A FORTRAN program for calculating the electrical parameters of extrinsic silicon
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-63 | ✔ Available |
Use of a time-shared computer system to control a Hall effect experiment
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:510 | ✔ Available |
Measurement methods for the semiconductor device industry
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:511 | ✔ Available |
Measurement of carrier lifetime in semiconductors
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:465 | ✔ Available |
Methods of measurement for semiconductor materials, process control, and devices
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46: V. 472 | ✔ Available |
| Joyner - Fed Docs Stacks | C 13.46: V. 475 | ✔ Available |
| Joyner - Fed Docs Stacks | C 13.46: V. 488 | ✔ Available |
| Joyner - Fed Docs Stacks | C 13.46: V. 495 | ✔ Available |
| Joyner - Fed Docs Stacks | C 13.46: V. 520 | ✔ Available |
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