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010 a| 73642169;

019 a| 1139364184;

022 a| 0090-8541l| 0090-8541z| 0565-629X2| 1;

035 a| (Sirsi) o01785732;

042 a| pcca| nsdp;

049 a| ER$A;

050 00 a| QC100b| .U5753 subsera| TK7871.85;

074 a| 0249-A;

086 0 a| C 13.46:;

100 1 a| Bullis, W. Murray,d| 1930-=| ^A434230;

222 0 a| Methods of measurement for semiconductor materials, process control, and devices. Quarterly report;

245 10 a| Methods of measurement for semiconductor materials, process control, and devices :b| quarterly report /c| edited by W. Murray Bullis.;

264 1 a| [Washington, D.C.] :b| National Bureau of Standards;

300 a| volumes :b| illustrations ;c| 25 cm.;

310 a| Quarterly;

336 a| textb| txt2| rdacontent;

337 a| unmediatedb| n2| rdamedia;

338 a| volumeb| nc2| rdacarrier;

490 1 a| NBS technical note;

500 a| Electronic Technology Division, Institute for Applied Technology.;

500 a| Jointly supported by Defense Atomic Support Agency, U.S. Naval Ammunition Depot and National Aeronautics and Space Administration.;

500 a| GPO Historic Shelflist Project- publication not in hand.;

500 a| Errata issued June 3, 1970; 1 page, 4 to.; distribition made by issuing office.;

500 a| GPO Cataloging Record Distribution Program (CRDP).;

650 0 a| Semiconductorsv| Periodicals.=| ^A1018793;

650 7 a| Semiconductors.2| fast0| (OCoLC)fst01112198;

655 7 a| Periodicals.2| fast0| (OCoLC)fst01411641;

700 1 a| Barody, A. J.,c| Jr.?| UNAUTHORIZED;

710 2 a| Institute for Applied Technology (U.S.).b| Electronic Technology Division.=| ^A450734;

710 1 a| United States.b| Defense Atomic Support Agency.=| ^A1038122;

710 1 a| United States.b| Navy Strategic Systems Projects Office.=| ^A450735;

710 1 a| United States.b| National Aeronautics and Space Administration.=| ^A5437;

710 1 a| United States.b| National Bureau of Standards,e| issuing body.=| ^A44678;

760 1 t| NBS technical note;

830 0 a| NBS technical note.=| ^A4336;

949 a| C 13.46:w| sudoch| joyner38;

596 a| 1;

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Methods of measurement for semiconductor materials, process control, and devices : quarterly report / edited by W. Murray Bullis.

Author/creator	Bullis, W. Murray, 1930-
Format	Book
Publication	[Washington, D.C.] : National Bureau of Standards
Description	volumes : illustrations ; 25 cm.
Subjects	Semiconductors--Periodicals.

Other author/creator	Barody, A. J., Jr.
Other author/creator	Institute for Applied Technology (U.S.). Electronic Technology Division.
Other author/creator	United States. Defense Atomic Support Agency.
Other author/creator	United States. Navy Strategic Systems Projects Office.
Other author/creator	United States. National Aeronautics and Space Administration.
Other author/creator	United States. National Bureau of Standards, issuing body.
Frequency	Quarterly
Series	NBS technical note NBS technical note. ^A4336
General note	Electronic Technology Division, Institute for Applied Technology.
General note	Jointly supported by Defense Atomic Support Agency, U.S. Naval Ammunition Depot and National Aeronautics and Space Administration.
General note	GPO Historic Shelflist Project- publication not in hand.
General note	Errata issued June 3, 1970; 1 page, 4 to.; distribition made by issuing office.
General note	GPO Cataloging Record Distribution Program (CRDP).
Succeeding title	Institute for Applied Technology (U.S.). Electronic Technology Division. Semiconductor measurement technology: quarterly report 0145-4676
Genre/form	Periodicals.
LCCN	73642169
ISSN	0090-8541 0090-8541 0565-629X
GPO item number	0249-A
Govt. docs number	C 13.46:

Holdings

Library	Location	Holdings
Joyner	Fed Docs Stacks C 13.46:	(July 1, 1968-June 30, 1973)

Availability

Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.46: V. 472	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 475	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 488	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 495	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 520	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 527	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 555	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 560	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 571	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 592	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 598	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 702	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 717	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 727	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 733	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 743	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 754	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 773	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 788	✔ Available	Place Hold
Joyner	Fed Docs Stacks	C 13.46: V. 806	✔ Available	Place Hold

Methods of measurement for semiconductor materials, process control, and devices : quarterly report / edited by W. Murray Bullis.

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