Measurement of carrier lifetime in semiconductors : an annotated bibliography covering the period 1949-1967 / W. Murray Bullis.

Author/creator Bullis, W. Murray, 1930-
Other author Institute for Applied Technology (U.S.). Electronic Technology Division.
Other author United States. National Bureau of Standards.
Format Book
Publication[Washington, D.C.] : National Bureau of Standards, 1968.
Descriptionii, 62 pages ; 26 cm
Subjects

SeriesNBS technical note ; 465
NBS technical note ; https://id.loc.gov/authorities/names/n42033257 465. ^A4336
General noteNov. 1968
General noteElectronic Technology Division, Institute for Applied Technology.
General noteGPO Historic Shelflist Project- publication not in hand.
General noteGPO Cataloging Record Distribution Program (CRDP).
Genre/formBibliographies.
Genre/formBibliographies.
LCCN71600484
GPO item number0249-A
Govt. docs number C 13.46:465

Availability

Library Location Call Number Status Item Actions
Joyner Fed Docs Stacks C 13.46:465 ✔ Available Place Hold