Measurement of carrier lifetime in semiconductors : an annotated bibliography covering the period 1949-1967 / W. Murray Bullis.
| Author/creator | Bullis, W. Murray, 1930- |
| Other author | Institute for Applied Technology (U.S.). Electronic Technology Division. |
| Other author | United States. National Bureau of Standards. |
| Format | Book |
| Publication | [Washington, D.C.] : National Bureau of Standards, 1968. |
| Description | ii, 62 pages ; 26 cm |
| Subjects |
| Series | NBS technical note ; 465 NBS technical note ; https://id.loc.gov/authorities/names/n42033257 465. ^A4336 |
| General note | Nov. 1968 |
| General note | Electronic Technology Division, Institute for Applied Technology. |
| General note | GPO Historic Shelflist Project- publication not in hand. |
| General note | GPO Cataloging Record Distribution Program (CRDP). |
| Genre/form | Bibliographies. |
| Genre/form | Bibliographies. |
| LCCN | 71600484 |
| GPO item number | 0249-A |
| Govt. docs number | C 13.46:465 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.46:465 | ✔ Available | Place Hold |