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Ion implantation techniques
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7871.85 .I587 1982 | ✔ Available |
Angular sensitivity of controlled implanted doping profiles
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-49 | ✔ Available |
The theoretical and experimental study of the temperature and dopant density dependence of hole mobility, effective mass, and resistivity in boron-doped silicon
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C13.10:400-47 | ✔ Available |