"Microelectronics+Reliability." - ECU Libraries Catalog

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Cover image for Reliability prediction for microelectronics

Reliability prediction for microelectronics

by Bernstein, Joseph B.
2024
Format: Electronic

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Cover image for Electronics reliability and measurement technology

Electronics reliability and measurement technology

by Electronics Reliability and Measurement Technology Workshop
1987
Format: Book

Location	Call #	Status
Joyner - Microforms B300	NAS 1.55:2472	✔ Available

Cover image for Strain-engineered MOSFETs

Strain-engineered MOSFETs

by Maiti, C. K.
2012
Format: Electronic

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Cover image for Lead-free solder interconnect reliability

Lead-free solder interconnect reliability

2005
Format: Electronic

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Cover image for Polytronic 2005

Polytronic 2005

by International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics
2006
Format: Electronic

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Cover image for 2004 4th IEEE International Conference on Polymers and Adhesives in Microelectronics and Photonics

2004 4th IEEE International Conference on Polymers and Adhesives in Microelectronics and Photonics

by International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics
2004
Format: Electronic

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Cover image for POLYTRONIC 2002

POLYTRONIC 2002

by International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics
2002
Format: Electronic

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Cover image for Polytronic 2006 - 6th International Conference on Polymers and Adhesives in Microelectronics and Photonics

Polytronic 2006 - 6th International Conference on Polymers and Adhesives in Microelectronics and Photonics

by International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics
2007
Format: Electronic

Location
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