Reliability prediction for microelectronics / Joseph B Bernstein, Alain A. Bensoussan, Emmanuel (Carl) Bender.

Author/creator Bernstein, Joseph B.
Other author Bensoussan, Alain A.
Other author Bender, Emmanuel (Carl)
Format Electronic
Publication InfoHoboken, NJ : Wiley, 2024.
Descriptionpages cm.
Supplemental ContentFull text available from eBooks on EBSCOhost
Subjects

SeriesQuality and reliability engineering series
Contents Conventional electronic system reliability prediction -- The fundamentals of failure -- Physics of failure based circuit reliability -- Transition state theory -- Multiple failure mechanism in reliability prediction -- System reliability -- Device failure mechanism -- Reliability modeling of electronic packages.
Abstract "Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics, in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Handbook of Physics-of-Failure Based Microelectronic Systems meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing"-- Provided by publisher.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2023054321
ISBN9781394210930 (hardback)
ISBN(adobe pdf)
ISBN(epub)

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available