Electronics reliability and measurement technology : proceedings of a conference ... held at Langley Research Center, Hampton, Virginia, June 3-5, 1986 / edited by Joseph S. Heyman.
| Author/creator | Electronics Reliability and Measurement Technology Workshop |
| Other author | Heyman, Joseph S. |
| Other author | United States. National Aeronautics and Space Administration. Scientific and Technical Information Program. |
| Format | Book |
| Publication Info | [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va.] : [National Technical Information Service, distributor], [1987] |
| Description | 1 volume. |
| Series | NASA conference publication ; 2472 NASA conference publication 2472. ^A297057 |
| General note | Distributed to depository libraries in microfiche. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1987] 2 microfiches. |
| GPO item number | 0830-H-10 (MF) |
| Govt. docs number | NAS 1.55:2472 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.55:2472 | ✔ Available |