"Electronic digital computers+Circuits.+Testing." - ECU Libraries Catalog

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Cover image for 2007 IEEE International Test Conference

2007 IEEE International Test Conference

2007
Format: Electronic

Location
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Cover image for Proceedings

Proceedings

by International Test Conference
1997
Format: Electronic

Location
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Cover image for Proceedings

Proceedings

by International Test Conference
1994
Format: Electronic

Location
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Cover image for 2018 IEEE International Test Conference in Asia (ITC Asia)

2018 IEEE International Test Conference in Asia (ITC Asia)

by IEEE Staff
2018
Format: Electronic

Location
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Cover image for Asian Test Symposium (ATS 2004)

Asian Test Symposium (ATS 2004)

by Institute of Electrical and Electronics Engineers, Inc. Staff
2004
Format: Electronic

Location
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Cover image for Proceedings

Proceedings

by International Test Conference
1996
Format: Electronic

Location
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Cover image for Proceedings of the 15th Asian Test Symposium

Proceedings of the 15th Asian Test Symposium

by Asian Test Symposium
2006
Format: Electronic

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Proceedings

by Asian Test Symposium
2010
Format: Electronic

Location
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Cover image for 11th Asian Test Symposium (ATS'02)

11th Asian Test Symposium (ATS'02)

by Asian Test Symposium
2002
Format: Electronic

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Cover image for Proceedings

Proceedings

by Asian Test Symposium
1992
Format: Electronic

Location
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