Proceedings 2010 19th IEEE Asian Test Symposium : ATS 2010 : 1-4 December 2010, Shanghai, China / [sponsored by IEEE Computer Society Test Technology Council].
| Author/creator | Asian Test Symposium |
| Other author | IEEE Computer Society. Technical Council on Test Technology. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | xviii, 453 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Cover title | 19th Asian Test Symposium |
| Portion of title | Asian Test Symposium |
| Added title page | ATS 2010 |
| General note | "IEEE Computer Society Order Number P4248"--T.p. verso. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2012419560 |
| ISBN | 9780769542485 |
| ISBN | 0769542484 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |