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111 2 a| Asian Test Symposium.=| ^A728103;

210 0 a| Proceedingsb| (Asian Test Symp., Online);

222 0 a| Proceedingsb| (Asian Test Symposium. Online);

240 10 a| Proceedings (Online)=| ^A728103;

245 10 a| Proceedingsh| [electronic resource].;

246 13 a| ATS ... proceedingsf| 1992-1993;

246 1 i| Volumes for 1993-1996 have title:a| Proceedings of the ... Asian Test Symposium;

260 a| Los Alamitos, Calif. :b| IEEE Computer Society Press,c| ℗♭1992-;

310 a| Annual;

362 1 a| Began with 1st (Nov. 26-27, 1992).;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

550 a| Sponsored by: IEEE Computer Society Test Technology Technical Committee and various local groups.;

588 1 a| 23th (Nov. 16-19, 2014).;

650 0 a| Electronic circuitsx| Testingv| Congresses.=| ^A323721;

650 0 a| Fault-tolerant computingv| Congresses.=| ^A238562;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| IEEE Xplore (Online service)1| https://id.oclc.org/worldcat/entity/E39QH7JmrJyCrDgchBTmfvkHxt.=| ^A534875;

776 1 a| Asian Test Symposium.s| Proceedings (CD-ROM)w| (DLC) 2004242229w| (OCoLC)57144540;

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Proceedings

Author/creator	Asian Test Symposium
Other author	IEEE Computer Society. Test Technology Technical Committee.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society Press, ℗♭1992-
Supplemental Content	Click here for full text
Subjects	Electronic circuits--Testing. --Congresses. Electronic digital computers--Circuits. --Testing. --Congresses. Fault-tolerant computing--Congresses.

Uniform title	Proceedings (Online)
Other title	ATS ... proceedings 1992-1993
Variant title	Volumes for 1993-1996 have title: Proceedings of the ... Asian Test Symposium
Frequency	Annual
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Issuing body	Sponsored by: IEEE Computer Society Test Technology Technical Committee and various local groups.
Source of description	23th (Nov. 16-19, 2014).
Issued in other form	Print version: Asian Test Symposium. Proceedings 1081-7735
Genre/form	Electronic journals.
LCCN	2015200289
ISSN	2377-5386 1081-7735

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	Electronic Resources	Access Content Online	✔ Available

Proceedings

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