11th Asian Test Symposium (ATS'02) proceedings of the 11th Asian Test Symposium : 18-20 November, 2002, Guam, USA / sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan.
| Author/creator | Asian Test Symposium |
| Format | Electronic |
| Publication Info | Los Alamitos, California : IEEE Computer Society, |
| Description | xxi, 437 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Other author/creator | IEEE Computer Society. Test Technology Technical Committee. |
| Other author/creator | Denshi Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing. |
| Other author/creator | Special Interest Group on System LSI Design Methodology (Japan) |
| Other author/creator | IEEE Xplore (Online service) |
| Parallel title | ATS'02 |
| General note | "IEEE Computer Society Order Number PR01825"--T.p. verso. |
| General note | Proceedings for 1992- cataloged as a serial in LC. |
| Bibliography note | Includes bibliographic references and author index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also available via the World Wide Web. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2003545294 |
| ISBN | 0769518257 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |