Proceedings of the 15th Asian Test Symposium 20-23 November 2006, Fukuoka, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC).
| Author/creator | Asian Test Symposium |
| Other author | IEEE Computer Society Test Technology Council (TTTC). |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | xxiii, 451 p. : ill. ; 27 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | 15th Asian Test Symposium |
| Portion of title | Asian Test Symposium |
| Added title page | ATS '06 |
| General note | "IEEE Computer Society Order Number P2628"--T.p. verso. |
| General note | Proceedings for 1992- cataloged as a serial in LC. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2007297867 |
| ISBN | 0769522351 |
| ISBN | 9780769522357 |
| ISBN | 0769526284 |
| ISBN | 9780769526287 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |