Start Over
You searched for: author_facet Center for Electronics and Electrical Engineering (U.S.).

Search Results

Cover image for Double-level metallization

Double-level metallization

Location Call # Status
Joyner - Microforms B300 C 13.58/6:985-86 ✔ Available
Cover image for A calibration service for watt meters and watthour meters

A calibration service for watt meters and watthour meters

Location Call # Status
Joyner - Microforms B300 C 13.46:1179 ✔ Available
Cover image for A manual wafer probe station for an integrated circuit test system

A manual wafer probe station for an integrated circuit test system

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-68 ✔ Available
Cover image for A Schottky diode bridge sampling gate

A Schottky diode bridge sampling gate

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:1121 ✔ Available
Cover image for Accurate linewidth measurement on integrated-circuit photomasks

Accurate linewidth measurement on integrated-circuit photomasks

  • 1980
  • Format: Book
Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-43 ✔ Available
Cover image for A FORTRAN program for calculating the electrical parameters of extrinsic silicon

A FORTRAN program for calculating the electrical parameters of extrinsic silicon

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-63 ✔ Available
Cover image for Large scale integration digital testing

Large scale integration digital testing

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:1102 ✔ Available
Cover image for NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials

NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-58 ✔ Available
Cover image for Semiconductor measurement technology

Semiconductor measurement technology

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-36 ✔ Available
Joyner - Fed Docs Stacks C 13.10:400-38 ✔ Available
Joyner - Fed Docs Stacks C 13.10:400-45 ✔ Available