Tools

LEADER 02900cas a2200589 4500

001 ocm04525980;

003 OCoLC;

005 20141212182328.0;

008 790105u1976uuuudcuuu p b f0 a0eng d;

010 a| 80646640;

012 a| 3b| 3;

030 a| XNBSAV;

035 a| (Sirsi) o04525980;

035 a| (OCoLC)4525980;

037 b| 20402;

042 a| lc;

049 a| ER$A;

050 00 a| QC100b| .U57 subsera| TK7871.85;

074 a| 247;

082 0 a| 602/.18 sa| 621.3815/2/028;

086 0 a| C 13.10:400;

110 2 a| Center for Electronics and Electrical Engineering (U.S.).b| Electron Devices Division.=| ^A598067;

245 10 a| Semiconductor measurement technology.;

260 a| [Washington, D.C.] :b| U.S. Dept. of Commerce, National Bureau of Standards :b| [for sale by the Supt. of Docs., U.S. Govt. Print. Off.];

300 a| volumes :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

362 0 a| July/Sept. 1976-;

490 1 a| NBS special publication;

500 a| "Progress report.";

504 a| Includes bibliographical references.;

550 a| Vols. for July/Sept. 1976-<Oct. 1976/Mar. 1977> jointly supported by: National Bureau of Standards, Navy Strategic Systems Projects Office, Defense Nuclear Agency, Defense Advanced Research Projects Agency, Energy Research and Development Administration; (July/Sept. 1976 with Space and Missile Systems Organization; Oct. 1976/ Mar. 1977- with Naval Ocean Systems Center).;

650 0 a| Semiconductorsx| Testing.=| ^A65728;

710 1 a| United States.b| National Bureau of Standards.=| ^A44678;

710 1 a| United States.b| Navy Strategic Systems Projects Office.=| ^A450735;

710 1 a| United States.b| Defense Nuclear Agency.=| ^A204747;

710 1 a| United States.b| Defense Advanced Research Projects Agency.=| ^A87541;

710 1 a| United States.b| Energy Research and Development Administration.=| ^A84163;

710 2 a| Space and Missile Systems Organization (U.S.)=| ^A598066;

710 2 a| Naval Ocean Systems Center (U.S.)=| ^A443573;

780 00 a| Institute for Applied Technology (U.S.). Electronic Technology Division.t| Semiconductor measurement technology: progress reportw| (DLC) 80646639w| (OCoLC)2980496;

830 0 a| NBS special publication.=| ^A2701;

850 a| DLCa| MH-CSa| PPD;

994 a| C0b| ERE;

936 a| July/Sept. 1976;

596 a| 1;

998 a| 997887;

999 a| C 13.10:400-36w| SUDOCc| 1i| 30372013331464d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSJOu| 6/8/2005x| JOURNALz| JFEDDOCSo| .STAFF. 0;

999 a| C 13.10:400-38w| SUDOCc| 1i| 30372013331472d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSJOu| 6/8/2005x| JOURNALz| JFEDDOCSo| .STAFF. 0;

999 a| C 13.10:400-45w| SUDOCc| 1i| 30372013331480d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSJOu| 6/8/2005x| JOURNALz| JFEDDOCSo| .STAFF. 0;

Semiconductor measurement technology.

Author/creator	Center for Electronics and Electrical Engineering (U.S.).
Format	Book
Publication Info	[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
Description	volumes : illustrations ; 26 cm.
Subjects	Semiconductors--Testing.

Other author/creator	United States. National Bureau of Standards.
Other author/creator	United States. Navy Strategic Systems Projects Office.
Other author/creator	United States. Defense Nuclear Agency.
Other author/creator	United States. Defense Advanced Research Projects Agency.
Other author/creator	United States. Energy Research and Development Administration.
Other author/creator	Space and Missile Systems Organization (U.S.)
Other author/creator	Naval Ocean Systems Center (U.S.)
Series	NBS special publication NBS special publication. ^A2701
General note	"Progress report."
Bibliography note	Includes bibliographical references.
Issuing body	Vols. for July/Sept. 1976- jointly supported by: National Bureau of Standards, Navy Strategic Systems Projects Office, Defense Nuclear Agency, Defense Advanced Research Projects Agency, Energy Research and Development Administration; (July/Sept. 1976 with Space and Missile Systems Organization; Oct. 1976/ Mar. 1977- with Naval Ocean Systems Center).
Preceding title	Institute for Applied Technology (U.S.). Electronic Technology Division. Semiconductor measurement technology: progress report
LCCN	80646640
GPO item number	247
Govt. docs number	C 13.10:400
Stock number	20402

Holdings

Library	Location	Holdings
Joyner	Fed Docs Stacks C 13.10:400	no. 36,38,45 - (July 1976-Sept. 1977)

Availability

Library	Location	Call Number	Status
Joyner	Fed Docs Stacks	C 13.10:400-36	✔ Available
Joyner	Fed Docs Stacks	C 13.10:400-38	✔ Available
Joyner	Fed Docs Stacks	C 13.10:400-45	✔ Available

Semiconductor measurement technology.

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Holdings

Availability