Tools

LEADER 01948cam a2200469 a 4500

001 ocm07695149;

003 OCoLC;

005 20141212182334.0;

008 811203s1981 dcua b f000 0 eng c;

010 a| 81600033;

020 c| $2.00;

035 a| (Sirsi) o07695149;

035 a| (OCoLC)7695149;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-68a| TK7874;

086 0 a| C 13.10:400-68;

100 1 a| Carver, G. P.=| ^A429631;

245 12 a| A manual wafer probe station for an integrated circuit test system /c| G.P. Carver and W.A. Cullins.;

260 a| Washington, D.C. :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. G.P.O.,c| 1981.;

300 a| iv, 14 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| NBS special publication ;v| 400-68;

490 1 a| Semiconductor measurement technology;

500 a| "Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.";

500 a| "Issued May 1981.";

500 a| S/N 003-003-02319-1.;

500 a| Item 247.;

504 a| Includes bibliographical references.;

650 0 a| Integrated circuitsx| Testing.=| ^A450737;

650 0 a| Probes (Electronic instruments)=| ^A38846;

700 1 a| Cullins, W. C.?| UNAUTHORIZED;

710 1 a| United States.b| National Bureau of Standards.=| ^A44678;

710 2 a| Center for Electronics and Electrical Engineering (U.S.).b| Electron Devices Division.=| ^A598067;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-68.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997996;

999 a| C 13.10:400-68w| SUDOCc| 1i| 30372013334179d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.

Author/creator	Carver, G. P.
Other author	Cullins, W. C.
Other author	United States. National Bureau of Standards.
Other author	Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.
Format	Book
Publication Info	Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
Description	iv, 14 pages : illustrations ; 26 cm.
Subjects	Integrated circuits--Testing. Probes (Electronic instruments)

Series	NBS special publication ; 400-68 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-68. ^A2701
General note	"Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
General note	"Issued May 1981."
General note	S/N 003-003-02319-1.
General note	Item 247.
Bibliography note	Includes bibliographical references.
LCCN	81600033
Govt. docs number	C 13.10:400-68

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A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.

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