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Cover image for Introduction to optical testing

Introduction to optical testing

Location Call # Status
Joyner - General Stacks TS514 .G43 1993 ✔ Available
Cover image for Digital and analogue instrumentation

Digital and analogue instrumentation

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Cover image for A Precision programmable step generator for use in automated test systems

A Precision programmable step generator for use in automated test systems

  • 1986
  • Format: Microform
Location Call # Status
Joyner - Microforms B300 C 13.46:1230 ✔ Available
Cover image for Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics

Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-30 ✔ Available
Cover image for A manual wafer probe station for an integrated circuit test system

A manual wafer probe station for an integrated circuit test system

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-68 ✔ Available
Cover image for Spherical near-field scanning

Spherical near-field scanning

Location Call # Status
Joyner - Microforms B300 C 13.58:90-3955 ✔ Available
Cover image for Biocompatibility and performance of medical devices

Biocompatibility and performance of medical devices

  • 2020
  • Format: Electronic
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Cover image for Trends in development of medical devices

Trends in development of medical devices

  • 2020
  • Format: Electronic
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Cover image for A wafer chuck for use between -196 and 350⁰C

A wafer chuck for use between -196 and 350⁰C

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-55 ✔ Available
Cover image for Fundamentals of test measurement instrumentation

Fundamentals of test measurement instrumentation

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