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Proceedings
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International Test Conference
1996
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Proceedings
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International Test Conference
1997
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Proceedings
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International Test Conference
1994
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Thermal-aware testing of digital VLSI circuits and systems
by
Chattopadhyay, Santanu
2018
First edition
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2007 IEEE International Test Conference
2007
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2018 IEEE International Test Conference in Asia (ITC Asia)
by
IEEE Staff
2018
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New frontiers in testing
by
International Test Conference
1988
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Proceedings
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European Test Workshop
1995
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Proceedings
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International Test Conference
1995
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Proceedings, International Test Conference 1999
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International Test Conference
1999
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