Tools

LEADER 02933cam a2200529 a 4500

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003 WaSeSS;

005 20240512155341.0;

006 m d ;

007 cr n ;

008 880401s1988 dcua sb 101 0 eng d;

010 a| 88070912;

020 a| 0818608706 (pbk.);

020 a| 0818648708 (microfiche);

020 a| 081868870X (hard);

035 a| (WaSeSS)ssj0000443595;

040 a| DLCc| DLCd| DLCd| WaSeSS;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .I593 1988;

082 00 a| 621.3952| 19;

111 2 a| International Test Conferenced| (1988 :c| Washington, D.C.)?| UNAUTHORIZED;

245 10 a| New frontiers in testingh| [electronic resource] :b| International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /c| sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section.;

260 a| Washington, D.C. :b| Computer Society Press of the IEEE,;

300 a| xxx, 1005 p. :b| ill. ;c| 28 cm.;

500 a| "Computer Society order number 870.";

500 a| "IEEE catalog number 88CH2610-4.";

504 a| Includes bibliographies and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Automatic test equipmentv| Congresses.=| ^A653928;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| Institute of Electrical and Electronics Engineers.b| Philadelphia Section.=| ^A724775;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D213;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D213;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D213;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4674448;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4674448-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 3/22/2017x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4674448-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 3/22/2017x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4674448-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 3/22/2017x| EBOOKz| JERESOURCE;

New frontiers in testing International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section.

Author/creator	International Test Conference
Other author	IEEE Computer Society. Test Technology Technical Committee.
Other author	Institute of Electrical and Electronics Engineers. Philadelphia Section.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Washington, D.C. : Computer Society Press of the IEEE,
Description	xxx, 1005 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Integrated circuits--Testing. --Congresses. Electronic digital computers--Circuits. --Testing. --Congresses. Automatic test equipment--Congresses.

General note	"Computer Society order number 870."
General note	"IEEE catalog number 88CH2610-4."
Bibliography note	Includes bibliographies and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	88070912
ISBN	0818608706 (pbk.)
ISBN	0818648708 (microfiche)
ISBN	081868870X (hard)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL)	✔ Available

New frontiers in testing International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section.

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