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020 a| 078035754X (casebound);

020 a| 0780357558 (microfiche);

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111 2 a| International Test Conferencen| (30th :d| 1999 :c| Atlantic City, N.J.)?| UNAUTHORIZED;

245 10 a| Proceedings, International Test Conference 1999h| [electronic resource];

246 30 a| Proceedings :b| International Test Conference 1999;

246 14 a| 1999 IEEE International Test Conference;

246 30 a| IEEE International Test Conference;

246 30 a| International Test Conference 1999;

246 30 a| International Test Conference;

260 a| Washington, D.C. :b| International Test Conference ;a| Piscataway, NJ :b| IEEE Service Center,;

300 a| xiv, 1163 p. :b| ill. ;c| 29 cm.;

500 a| Proceedings of the 30th ITC Conference held Sept. 28-30, 1999 in Atlantic City, N.J., sponsored by IEEE Computer Society.;

500 a| "IEEE Catalog Number 99CH37034"--T.p. verso.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Embedded computer systemsx| Testingv| Congresses.=| ^A422987;

650 0 a| Microprocessorsx| Testingv| Congresses.=| ^A77773;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Computer Society.=| ^A53823;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6540;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6540;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6540;

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Proceedings, International Test Conference 1999

Author/creator	International Test Conference
Other author	IEEE Computer Society.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Washington, D.C. : International Test Conference ; Piscataway, NJ : IEEE Service Center,
Description	xiv, 1163 p. : ill. ; 29 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Integrated circuits--Testing. --Congresses. Electronic digital computers--Circuits. --Testing. --Congresses. Embedded computer systems--Testing. --Congresses. Microprocessors--Testing. --Congresses.

Portion of title	Proceedings : International Test Conference 1999
Cover title	1999 IEEE International Test Conference
Portion of title	IEEE International Test Conference
Portion of title	International Test Conference 1999
Portion of title	International Test Conference
General note	Proceedings of the 30th ITC Conference held Sept. 28-30, 1999 in Atlantic City, N.J., sponsored by IEEE Computer Society.
General note	"IEEE Catalog Number 99CH37034"--T.p. verso.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	00703275
ISBN	0780357531 (softbound)
ISBN	078035754X (casebound)
ISBN	0780357558 (microfiche)

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Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings	✔ Available

Proceedings, International Test Conference 1999

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