/LC.GIF&client=easterncarolinaedu)
Proceedings / International Test Conference 1995.
| Author/creator | International Test Conference |
| Other author | IEEE Computer Society. Test Technology Technical Committee. |
| Other author | Institute of Electrical and Electronics Engineers. Philadelphia Section. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Altoona, PA : The Conference, |
| Description | xii 1011 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Subjects |
| Cover title | Driving down the cost of test |
| General note | "October 21-25, 1995 ... Washington, D.C., USA"--Cover. |
| General note | Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover. |
| General note | "IEEE catalog number 95CH35858"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 95079385 |
| ISBN | 0780329929 (casebound) |
| ISBN | 0780329910 (softbound) |
| ISBN | 0780329937 (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |