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The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.48/4:260-131 | ✔ Available |
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.10:260-131 | ✔ Available |
Semiconductor measurement technology
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-48 | ✔ Available |
Spreading Resistance Symposium
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-10 | ✔ Available |