The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements / J.R. Ehrstein, M.C. Croarkin.
| Author/creator | Ehrstein, James R. |
| Other author | Croarkin, M. C. (Mary Carroll), 1934- |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Edition | 1999 ed. |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1999. |
| Description | vi, 106 pages : illustrations. |
| Subjects |
| Variant title | Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements |
| Series | Standard reference materials NIST special publication ; 260-131 NIST special publication 260-131. ^A390056 Standard reference materials. ^A420608 |
| General note | "Supercedes NIST special publication 260-131, August 1997." |
| General note | Shipping list no.: 99-0777-M. |
| General note | "Issued June 1999." |
| Bibliography note | Includes bibliographical references (p. 44-45). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1999] 2 microfiches : negative. |
| GPO item number | 0248-B (MF) |
| Govt. docs number | C 13.48/4:260-131 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.48/4:260-131 | ✔ Available |