The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements / J.R. Ehrstein, M.C. Croarkin.
| Author/creator | Ehrstein, James R. |
| Other author | Croarkin, M. C. (Mary Carroll), 1934- |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997. |
| Description | xv, 84 pages : illustrations ; 28 cm. |
| Subjects |
| Variant title | Certification of one hundred mm diameter silicon resistivity SRMs ... |
| Series | Standard reference materials NIST special publication ; 260-131 NIST special publication 260-131. ^A390056 Standard reference materials. ^A420608 |
| General note | Shipping list no.: 98-0569-M. |
| General note | "August 1997." |
| Bibliography note | Includes bibliographical references. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 2 microfiches : negative. |
| GPO item number | 0247 (MF) |
| Govt. docs number | C 13.10:260-131 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.10:260-131 | ✔ Available |