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Planar test structures for characterizing impurities in silicon
1976
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.10:400-21

Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
by Spreading Resistance Symposium (1974 : Gaithersburg, Md.)
1974
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.10:400-10

ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses]
by Schafft, Harry A.
1974
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.10:400-9

2005 IEEE International Test Conference (ITC) 8-10 November, 2005, Austin, TX.
by International Test Conference (2005: : Austin, Texas.)
2005
Format: Electronic and Book

✔ Available

Call Number: Multiple Online Resources Available

NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials
by Workshop on the Stability of (Thin Film) Solar Cells and Materials (1978 : Gaithersburg, Md.)
1979
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.10:400-58

Recombination lifetime measurements in silicon
1998
Format: Electronic and Book

✔ Available

Call Number: Access Content Online

ARPA/NBS workshop IV : surface analysis for silicon devices
1976
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.10:400-23

✔ Available

Call Number: Multiple Online Resources Available

✔ Available

Call Number: Multiple Online Resources Available

ICMTS 1998 proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
by IEEE International Conference on Microelectronic Test Structures (1998 : Kanazawa-shi, Japan)
1998
Format: Electronic and Book

✔ Available

Call Number: Multiple Online Resources Available

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Planar test structures for characterizing impurities in silicon

Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974

ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses]

2005 IEEE International Test Conference (ITC) 8-10 November, 2005, Austin, TX.

NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials

Recombination lifetime measurements in silicon

ARPA/NBS workshop IV : surface analysis for silicon devices

2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan

ICMTS 2004 proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan

ICMTS 1998 proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan

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