Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.
| Other author | Gupta, D. C. (Dinesh C.) |
| Other author | Bacher, Fred R., 1955- |
| Other author | Hughes, William M., 1948- |
| Format | Electronic |
| Publication Info | West Conshohocken, PA : ASTM, |
| Description | 392 p. : ill. ; 24 cm. |
| Supplemental Content | Full text available from ASTM Standards and Engineering Digital Library |
| Subjects |
| General note | Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. |
| General note | "STP 1340." |
| Bibliography note | Includes bibliographical references and indexes. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 98022034 |
| ISBN | 0803124899 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |