/LC.GIF&client=easterncarolinaedu)
2005 IEEE International Test Conference (ITC) 8-10 November, 2005, Austin, TX.
| Author/creator | International Test Conference |
| Other author | Institute of Electrical and Electronics Engineers. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, N.J. : Institute of Electrical and Electronics Engineers, |
| Description | 2 v. (viii, 1323 p.) : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Portion of title | IEEE International Test Conference (ITC) |
| Portion of title | International Test Conference (ITC) |
| General note | "IEEE Catalogue Number: 05CH37661"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also issued online with additional title: Test Conference, 2005, proceedings, ITC 2005, IEEE International. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2006280338 |
| ISBN | 0780390385 (set) |
| Stock number | IEEE Xplore POP |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |