Subject: "Semiconductors" - ECU Libraries Catalog Search Results

The electrical characterization of semiconductors : measurement of minority carrier properties
by Orton, J. W. (John Wilfred)
1990
Format: Book and Print

✔ Available Joyner - General Stacks

Call Number: QC611.24 .O78 1990

Fundamentals of semiconductors : physics and materials properties
by Yu, Peter Y., 1944-
2001
Format: Book and Print

✔ Available Joyner - General Stacks

Call Number: QC611 .Y88 2001

Semiconductor material and device characterization
by Schroder, Dieter K.
1990
Format: Book and Print

✔ Available Joyner - General Stacks

Call Number: QC611 .S335 1990

✔ Available

Call Number: Access Content Online

Amorphous and liquid semiconductors
by Tauc, J. (Jan)
1974
Format: Book and Print

✔ Available Joyner - General Stacks

Call Number: QC611.8.A5 T38

A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967
by Schafft, Harry A.
1968
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.46:445

Measurement of carrier lifetime in semiconductors : an annotated bibliography covering the period 1949-1967
by Bullis, W. Murray, 1930-
1968
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.46:465

Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices
by French, Judson C.
1964
Format: Book and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: C 13.46:232

Methods of measurement for semiconductor materials, process control, and devices : quarterly report
by Bullis, W. Murray, 1930-
Format: Book, Journal, and Print

✔ Available View 20 Items

Library	Location	Call Number	Status
Joyner	Fed Docs Stacks	C 13.46: V. 472	✔ Available
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Joyner	Fed Docs Stacks	C 13.46: V. 788	✔ Available
Joyner	Fed Docs Stacks	C 13.46: V. 806	✔ Available

Rare earth and transition metal doping of semiconductor materials synthesis, magnetic properties and room temperature spintronics
2016
Format: Electronic and Book

✔ Available

Call Number: Multiple Online Resources Available

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The electrical characterization of semiconductors : measurement of minority carrier properties

Fundamentals of semiconductors : physics and materials properties

Semiconductor material and device characterization

Ultra clean processing of semiconductor surfaces XII selected, peer reviewed papers from the 12th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS) September 21-24, 2014, Brussels, Belgium

Amorphous and liquid semiconductors

A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967

Measurement of carrier lifetime in semiconductors : an annotated bibliography covering the period 1949-1967

Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices

Methods of measurement for semiconductor materials, process control, and devices : quarterly report

Rare earth and transition metal doping of semiconductor materials synthesis, magnetic properties and room temperature spintronics

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