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Electrical impact of SiC structural crystal defects on high electric field devices
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:209647 | ✔ Available |
Development of new techniques for the characterization of crystals and their growth solutions
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:100371 | ✔ Available |
| Joyner - Microforms B300 | NAS 1.15:100371 | ✔ Available |
| Joyner - Microforms B300 | NAS 1.15:100371 | ✔ Available |
Low cycle fatigue behavior of polycrystalline NiAl at 300 and 1000K
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:105987 | ✔ Available |
Electron diffraction evidence for the ordering of excess nickel atoms by relation to stoichiometry in nickel-rich B'-NiAl formation of a nickel-aluminum (Ni2Al) superlattice
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.77:20177 | ✔ Available |
Analysis of the defect structure of B2 FeAl alloys
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:107079 | ✔ Available |
Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:209648 | ✔ Available |
The influence of reduced gravity on the crystal growth of electronic materials
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:112495 | ✔ Available |