Electrical impact of SiC structural crystal defects on high electric field devices / Philip G. Neudeck.
| Author/creator | Neudeck, Philip G. |
| Other author | NASA Glenn Research Center. |
| Format | Microform |
| Publication Info | [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va.] : [National Technical Information Service, distributor], [1999] |
| Description | 1 volume. |
| Subjects |
| Series | NASA technical memorandum ; NASA/TM-1999-209647 NASA technical memorandum 209647. ^A467613 |
| General note | Shipping list no.: 2000-0603-M. |
| General note | CRDP Program record. |
| Reproduction note | Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000]. 1 microfiche. |
| Issued in other form | Online version: Neudeck, Philip G. Electrical impact of SiC structural crystal defects on high electric field devices |
| GPO item number | 0830-D (MF) |
| Govt. docs number | NAS 1.15:209647 |
| Stock number | 20000021375 NASA |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.15:209647 | ✔ Available |