Start Over
You searched for: author_facet Leedy, Kathryn O.

Search Results

Cover image for Catalog of federal metrology and calibration capabilities

Catalog of federal metrology and calibration capabilities

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:546/2 ✔ Available
Cover image for Notes on SEM examination of microelectronic devices

Notes on SEM examination of microelectronic devices

Location Call # Status
Joyner - Fed Docs Stacks C13.10:400-35 ✔ Available
Cover image for Scanning electron microscope examination of wire bonds from high-reliability devices

Scanning electron microscope examination of wire bonds from high-reliability devices

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:785 ✔ Available