Notes on SEM examination of microelectronic devices / John R. Devaney, K.O. Leedy, and W.J. Keery.

Author/creator Devaney, John R.
Other author Leedy, Kathryn O. author.
Other author Keery, W. J., author.
Format Book
Publication InfoWashington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Doc., U.S. Govt. Print. Off, 1977.
Descriptioniv, 48 pages : illustrations ; 26 cm.
Subjects

SeriesSemiconductor measurement technology
NBS special publication ; 400-35
Semiconductor measurement technology. ^A428054
NBS special publication 400-35. ^A2701
Bibliography noteIncludes bibliographical references.
LCCN 77608011
Govt. docs number C13.10:400-35

Availability

Library Location Call Number Status Item Actions
Joyner Fed Docs Stacks C13.10:400-35 ✔ Available Place Hold