Notes on SEM examination of microelectronic devices / John R. Devaney, K.O. Leedy, and W.J. Keery.
| Author/creator | Devaney, John R. |
| Other author | Leedy, Kathryn O. author. |
| Other author | Keery, W. J., author. |
| Format | Book |
| Publication Info | Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Doc., U.S. Govt. Print. Off, 1977. |
| Description | iv, 48 pages : illustrations ; 26 cm. |
| Subjects |
| Series | Semiconductor measurement technology NBS special publication ; 400-35 Semiconductor measurement technology. ^A428054 NBS special publication 400-35. ^A2701 |
| Bibliography note | Includes bibliographical references. |
| LCCN | 77608011 |
| Govt. docs number | C13.10:400-35 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C13.10:400-35 | ✔ Available | Place Hold |