Scanning electron microscope examination of wire bonds from high-reliability devices / Kathryn O. Leedy.

Author/creator Leedy, Kathryn O. author.
Other author United States. National Bureau of Standards, issuing body.
Format Book
Publication[Washington, D.C.] : [U.S. Dept. of Commerce, National Bureau of Standards], 1973.
Description1 volume (various paging) : illustrations ; 26 cm.
Subjects

SeriesNBS technical note ; 785
NBS technical note ; 785. ^A4336
General noteIssued August 1973.
General note"(Electronic Technology Division, Institute for Applied Technology.)"
General noteGPO Historic Shelflist Project- publication not in hand.
General noteGPO Cataloging Record Distribution Program (CRDP).
Bibliography noteIncludes bibliographical references (page 28).
GPO item number0249-A
Govt. docs number C 13.46:785

Availability

Library Location Call Number Status Item Actions
Joyner Fed Docs Stacks C 13.46:785 ✔ Available Place Hold