Scanning electron microscope examination of wire bonds from high-reliability devices / Kathryn O. Leedy.
| Author/creator | Leedy, Kathryn O. author. |
| Other author | United States. National Bureau of Standards, issuing body. |
| Format | Book |
| Publication | [Washington, D.C.] : [U.S. Dept. of Commerce, National Bureau of Standards], 1973. |
| Description | 1 volume (various paging) : illustrations ; 26 cm. |
| Subjects |
| Series | NBS technical note ; 785 NBS technical note ; 785. ^A4336 |
| General note | Issued August 1973. |
| General note | "(Electronic Technology Division, Institute for Applied Technology.)" |
| General note | GPO Historic Shelflist Project- publication not in hand. |
| General note | GPO Cataloging Record Distribution Program (CRDP). |
| Bibliography note | Includes bibliographical references (page 28). |
| GPO item number | 0249-A |
| Govt. docs number | C 13.46:785 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.46:785 | ✔ Available | Place Hold |