Tools

LEADER 01819cam a2200433 i 4500

001 ocm05535581;

003 OCoLC;

005 20141212182333.0;

008 800715s1979 dcua b f000 0 eng ;

010 a| 79600131;

020 c| $3.50;

035 a| (Sirsi) o05535581;

035 a| (OCoLC)5535581;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-59a| TK7871.85;

082 00 a| 602/.18 sa| 621.3815/2/02872| 19;

086 0 a| C 13.10:400-59;

100 1 a| Harman, George G.=| ^A598116;

245 10 a| Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques /c| George G. Harman ; sponsored in part by the Defense Advanced Research Projects Agency.;

260 a| Washington, D.C. :b| U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1979.;

300 a| v, 66 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Semiconductor measurement technology;

490 1 a| NBS special publication ;v| 400-59;

504 a| Includes bibliographical references.;

650 0 a| Semiconductorsx| Testing.=| ^A65728;

650 0 a| Semiconductor industryx| Quality control.=| ^A192044;

650 0 a| Nondestructive testing.=| ^A23224;

650 0 a| Acoustic emission testing.=| ^A321657;

710 1 a| United States.b| Defense Advanced Research Projects Agency.=| ^A87541;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-59.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997989;

999 a| C 13.10:400-59w| SUDOCc| 1i| 30372013334104d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques / George G. Harman ; sponsored in part by the Defense Advanced Research Projects Agency.

Author/creator	Harman, George G.
Other author	United States. Defense Advanced Research Projects Agency.
Format	Book
Publication Info	Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off, 1979.
Description	v, 66 pages : illustrations ; 26 cm.
Subjects	Semiconductors--Testing. Semiconductor industry--Quality control. Nondestructive testing. Acoustic emission testing.

Series	Semiconductor measurement technology NBS special publication ; 400-59 Semiconductor measurement technology. ^A428054 NBS special publication 400-59. ^A2701
Bibliography note	Includes bibliographical references.
LCCN	79600131
Govt. docs number	C 13.10:400-59

Availability

Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.10:400-59	✔ Available	Place Hold

Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques / George G. Harman ; sponsored in part by the Defense Advanced Research Projects Agency.

Click here for more information about this title

Availability