A reverse-bias safe operating area transistor tester / David W. Berning.
| Author/creator | Berning, David W. |
| Format | Book |
| Publication Info | Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1979. |
| Description | v, 37 pages : illustrations ; 26 cm. |
| Subjects |
| Series | NBS special publication ; 400-54 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-54. ^A2701 |
| Bibliography note | Includes bibliographical references (p. 14). |
| LCCN | 78600157 |
| Govt. docs number | C 13.10:400-54 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.10:400-54 | ✔ Available | Place Hold |