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LEADER 01680cam a2200409 i 4500

001 ocm05782427;

003 OCoLC;

005 20141212182332.0;

008 800321s1979 dcua b 000 0 eng ;

010 a| 79600178;

035 a| (Sirsi) o05782427;

035 a| (OCoLC)5782427;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-52a| TK7871.85;

082 0 a| 602/.18 sa| 621.3815/2/0287;

086 0 a| C 13.10:400-52;

100 1 a| Blackburn, David L.=| ^A453406;

245 13 a| An automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices /c| David L. Blackburn.;

260 a| Washington :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1979.;

300 a| iv, 35 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| NBS special publication ;v| 400-52;

490 1 a| Semiconductor measurement technology;

504 a| Includes bibliographical references.;

650 0 a| Semiconductorsx| Testingx| Equipment and supplies.=| ^A65728;

650 0 a| Semiconductor wafersx| Testing.=| ^A444257;

650 0 a| Siliconx| Electric properties.=| ^A420609;

650 0 a| Semiconductor industryx| Automation.=| ^A192044;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-52.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997982;

999 a| C 13.10:400-52w| SUDOCc| 1i| 30372013334021d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

An automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices / David L. Blackburn.

Author/creator	Blackburn, David L.
Format	Book
Publication Info	Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1979.
Description	iv, 35 pages : illustrations ; 26 cm.
Subjects	Semiconductors--Testing. --Equipment and supplies. Semiconductor wafers--Testing. Silicon--Electric properties. Semiconductor industry--Automation.

Series	NBS special publication ; 400-52 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-52. ^A2701
Bibliography note	Includes bibliographical references.
LCCN	79600178
Govt. docs number	C 13.10:400-52

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An automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices / David L. Blackburn.

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