Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes / James M. Kenney ; Electronic Technology Division.
| Author/creator | Kenney, James M. |
| Other author | Institute for Applied Technology (U.S.). Electronic Technology Division. |
| Other author | United States. Defense Nuclear Agency. |
| Format | Book |
| Publication Info | Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1976. |
| Description | 2 unnumbered pages, 26 pages, 1 unnumbered pages : illustrations ; 26 cm. |
| Subjects |
| Series | Semiconductor measurement technology NBS special publication ; 400-7 Semiconductor measurement technology. ^A428054 NBS special publication 400-7. ^A2701 |
| General note | CODEN: XNBSAV. |
| General note | Activity supported in cooperation with the Defense Nuclear Agency. |
| General note | Item 247. |
| General note | S/N 003-003-01635-7. |
| Issued in other form | Online version: Kenney, James M. Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes. Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976 |
| LCCN | 76005868 |
| GPO item number | 247 |
| Govt. docs number | C 13.10:400-7 |
| Stock number | 003-003-01635-7 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.10:400-7 | ✔ Available | Place Hold |