Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.
| Author/creator | Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films |
| Other author | Passaglia, Elio editor. |
| Other author | Stromberg, Robert R., editor. |
| Other author | Kruger, Jerome, editor. |
| Format | Book |
| Publication Info | Washington : U.S. National Bureau of Standards, 1964. |
| Description | vi, 359 pages : illustrations ; 24 cm. |
| Subjects |
| Series | United States. National Bureau of Standards. Miscellaneous publication ; 256 United States. National Bureau of Standards. Miscellaneous publication ; 256. UNAUTHORIZED |
| General note | Edited by E. Passaglia, R.R. Strombery, and J. Kruger. |
| Bibliography note | Includes bibliographies. |
| LCCN | 64060043 |
| Govt. docs number | C 13.10:256 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.10:256 | ✔ Available | Place Hold |