Medium-range order in amorphous silicon measured by fluctuation electron microscopy : final report, 23 June 1999-23 August 2002 / P.M. Voyles and J.R. Abelson.
| Author/creator | Voyles, P. M. |
| Other author | Abelson, John Robert. |
| Other author | National Renewable Energy Laboratory (U.S.) |
| Format | Electronic |
| Publication Info | Golden, Colo. : National Renewable Energy Laboratory, [2003] |
| Supplemental Content | https://purl.fdlp.gov/GPO/LPS49899 |
| Subjects |
| Variant title | Medium range order in amorphous silicon measured by fluctuation electron microscopy |
| Series | NREL/SR ; 520-34826 NREL/SR ; 520-34826. ^A577616 |
| General note | Title from title screen (viewed on June 7, 2004). |
| Technical details | Mode of access: Internet from the NREL web site. Address as of 6/7/04: http://www.nrel.gov/docs/fy04osti/34826.pdf; current access available via PURL. |
| Issued in other form | Voyles, Paul Marriner, 1974- Medium-range order in amorphous silicon measured by fluctuation electron microscopy iv, 30 p. |
| GPO item number | 0430-P-05 (online) |
| Govt. docs number | E 9.18:NREL/SR-520-34826 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |