Embedded digital system reliability and safety analyses / prepared by L.M. Kaufman, B.W. Johnson.
| Author/creator | Kaufman, L. M. |
| Other author | Johnson, B. W. |
| Other author | U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology. |
| Other author | University of Virginia. Center for Safety-Critical Systems. |
| Format | Microform |
| Publication Info | Washington, DC : Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 2001. |
| Description | xi, 75 p. : ill. ; 28 cm. |
| Subjects |
| Series | NUREG/GR 0020 NUREG/GR 0020. ^A436863 |
| General note | "University of Virginia, Department of Electrical Engineering, Center for Safety-Critical Systems." |
| General note | "Date published: February 2001." |
| General note | Paper version no longer available for sale by the Supt. of Docs. |
| General note | Shipping list no.: 2001-0340-M. |
| Bibliography note | Includes bibliographical references (p. 68-73). |
| Report note | Technical. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2001] 1 microfiche : negative. |
| Funding information | K6907. |
| GPO item number | 1051-H-13 (MF) |
| Govt. docs number | Y 3.N 88:58/0020 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | Y 3.N 88:58/0020 | ✔ Available |