Distributed testing of a device-level interface specification for a metrology system / John Horst [and others].

Other author Horst, John Albert.
Other author National Institute of Standards and Technology (U.S.)
Format Microform
Publication InfoGaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
Description19 pages : illustrations ; 28 cm.
Subjects

SeriesNISTIR ; 6851
NISTIR ; 6851. ^A682451
General note"January 2002."
General noteShipping list no.: 2002-0384-M.
Bibliography noteIncludes bibliographical references (p. 19).
Reproduction noteJoyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative.
GPO item number0247-D (MF)
Govt. docs number C 13.58:6851

Availability

Library Location Call Number Status Item Actions
Joyner Microforms B300 C 13.58:6851 ✔ Available