Measuring the performance and intelligence of systems : proceedings of the 2000 PerMIS Workshop, August 14-16, 2000 / edited by A.M. Meystel, E.R. Messina ; co-sponsored by: National Institute of Standards and Technology [and others].
| Author/creator | PerMIS Workshop |
| Other author | Meystel, A. (Alex) |
| Other author | Messina, E. R. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, Md. : The Institute ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., [2001] |
| Description | xi, 658 pages : illustrations ; 28 cm. |
| Subjects |
| Series | NIST special publication ; 970 NIST special publication 970. ^A390056 |
| General note | "September 2001." |
| General note | Shipping list no.: 2002-0120-M. |
| Bibliography note | Includes bibliographical references and index. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 7 microfiches : negative. |
| GPO item number | 0247 (MF) |
| Govt. docs number | C 13.10:970 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.10:970 | ✔ Available |