Applied logistic regression / David W. Hosmer, Stanley Lemeshow.

Author/creator Hosmer, David W.
Other author Lemeshow, Stanley.
Format Book
Edition2nd ed.
Publication InfoNew York : Wiley, ©2000.
Descriptionxii, 373 pages : illustrations ; 25 cm.
Subjects

SeriesWiley series in probability and statistics. Texts and references section
Wiley series in probability and statistics. Texts and references section. ^A405961
General note"A Wiley-Interscience publication."
Bibliography noteIncludes bibliographical references (p. 352-365) and index.
LCCN 00036843
ISBN0471356328 (cloth : alk. paper)

Availability

Library Location Call Number Status Item Actions
Joyner General Stacks QA278.2 .H67 2000 ✔ Available Place Hold