Randomness testing of the advanced encryption standard finalist candidates / Juan Soto, Lawrence Bassham.
| Author/creator | Soto, Juan, 1969- |
| Other author | Bassham, Lawrence E. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000] |
| Description | 14 pages : illustrations ; 28 cm. |
| Subjects |
| Series | NISTIR ; 6483 NISTIR ; 6483. ^A682451 |
| General note | Shipping list no.: 2000-0794-M. |
| General note | "April 2000." |
| Bibliography note | Includes bibliographical references (p. 10). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2000] 1 microfiche : negative. |
| GPO item number | 0247-D (MF) |
| Govt. docs number | C 13.58:6483 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.58:6483 | ✔ Available |