Testability of product data management interfaces / David Flater, KC Morris.

Author/creator Flater, David
Other author Morris, K. C.
Other author National Institute of Standards and Technology (U.S.)
Format Microform
Publication InfoGaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
Description20 pages : illustrations.
Subjects
CAD/CAM systems--Specifications. --United States.
CAD/CAM systems--United States. --Testing.
Computer interfaces--Specifications. --United States.
Computer interfaces--United States. --Testing.

SeriesNISTIR ; 6429
NISTIR ; 6429. ^A682451
General noteShipping list no.: 2000-0425-M.
General note"November 1999."
Bibliography noteIncludes bibliographical references (p. 18-20).
Reproduction noteJoyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2000] 1 microfiches : negative.
GPO item number0247-D (MF)
Govt. docs number C 13.58:6429

Availability

Library Location Call Number Status Item Actions
Joyner Microforms B300 C 13.58:6429 ✔ Available