Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 / Philip D. LaFleur, editor.

Author/creator Materials Research Symposium
Other author LaFleur, Philip D.
Format Book
Publication InfoWashington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1976-
Descriptionvolumes : illustrations ; 24 cm.
Subjects

SeriesNBS special publication ; 422
NBS special publication 422. ^A2701
Bibliography noteIncludes bibliographical references.
LCCN 75619250
Govt. docs number C 13.10:422

Availability

Library Location Call Number Status Item Actions
Joyner Fed Docs Stacks C 13.10:422 V. 1 ✔ Available Place Hold
Joyner Fed Docs Stacks C 13.10:422 V. 2 ✔ Available Place Hold