The Destructive bond pull test / John Albers, editor.
| Other author | Albers, John. |
| Format | Book |
| Publication Info | [Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1976. |
| Description | vi, 44 pages : illustrations ; 26 cm. |
| Subjects |
| Series | Semiconductor measurement technology National Bureau of Standards special publication ; 400-18 Semiconductor measurement technology. ^A428054 NBS special publication 400-18. ^A2701 |
| General note | "Jointly supported by: the National Bureau of Standards, the Defense Nuclear Agency, and the Navy Strategic Systems Project Office." |
| Bibliography note | Includes bibliographical references. |
| LCCN | 75619425 |
| Govt. docs number | C 13.10:400-18 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.10:400-18 | ✔ Available | Place Hold |